EPON 行通信性能物理層關(guān)鍵技術(shù)研究

本文針對EPON 上行突發(fā)傳輸?shù)奶攸c，在物理層上分析了影響上行突發(fā)傳輸性能的關(guān)鍵技術(shù)，并針對這些關(guān)鍵技術(shù)提出了實現(xiàn)方案，利用Verilog 硬件描述語言編寫了驗證代碼，進行了仿真。實際EPON 系統(tǒng)測試結(jié)果表明傳輸誤碼率小于0.03%。
關(guān)鍵字：光線路終端；CRC 校驗；以太無源光網(wǎng)絡(luò)
The Key Technology Study on the Physical Communication Performance of the the EPON Upstream ZHANG JUNJIE , SHI JUN, HONG LIANG (Key Laboratory of Special Fiber Optics and Optical Access Networks (Shanghai University) Ministry of Education, Shanghai 200072)
Abstract: This paper studies the key technologies which affect the communication performance in the EPON system with a burst-mode in the uplink path. The solution to improve the performance is put forward using Verilog code, and the simulation results verify the code. The bit error ratio is less than 0.03% on the practical EPON test platform.
Keywords: OLT ; CRC Verification ; EPON